• Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)
  • Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)
  • Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)
  • Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)
  • Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)
  • Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)

Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)

After-sales Service: 1 Year
Warranty: 1 Year
Power Supply: AC 100~240V 50/60Hz
Communication Port: RS-232, Gpib, Ethernet
Working Environment: 25±10ºC
Transport Package: 1PCS/Box
Samples:
US$ 500/Piece 1 Piece(Min.Order)
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Customization:
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Manufacturer/Factory

Basic Info.

Model NO.
CS200-1003C
Specification
354mm x 482mm x552mm
Trademark
Precise
Origin
China
Production Capacity
5000

Product Description

Introduction
Precise plug-in host machine adopts a custom framework, backboard bus bandwidth up to 3Gbps, support 16 trigger bus, to meet the needs of high speed communication of multi-card devices.
 In order to meet the different needs of customers for the number of sub-cards, two host machine(1003C and 1010C) have been launched. 1003C can hold up to 3 sub-cards, and 1010C can hold up to 10 sub-cards.We also have developed four sub cards (CS100,CS200,CS300 and CS400) for users to flexibly configure different sub-cards according to their functional and performance requirements  to achieve the optimal cost-effective collocation.


Characteristics
Flexible channel trigger bus 
High efficiency of multi-card combination
Up to 40 channels of configuration
High-accuracy at 0.1%
Four-quadrant operation, range: 10pA~1A , 30uV~300V
Multiple communication interfaces RS-232/GPIB/LAN

 
Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)

Host machine
Model 1003C 1010C
No.of slots 3 slots 10 slots
Communication port RS-232,GPIB, Ethernet RS-232,GPIB, Ethernet
Power supply AC 100~240V 50/60Hz max power 500W AC 100~240V 50/60Hz max power 500W
Working environment 25±10ºC 25±10ºC
Size 178mm×482mm×552mm  178mm×482m × 552mm 
Warranty 1 year 1 year

Sub-card
Model CS200
No. of channels 1 channel
Max output power 30W, 4 quadrant source or hydrazine mode
Source limit ±30V (≤1A range), ±105mA (≤100V range)
Current source  ±1.05A (≤30V range), ±105mA (≤100V range)  
Over range  105% range, source and measurement
Stable load capacitance  <22nF
Broadband noise (20MHz) 2mV RMS , <20mV vp-p
Cable protection voltage output impedance 1K ω, output voltage offset <10mV
Max sampling rate 1000 Sample/ s
Warranty 1 year
Quadrant table Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)

Voltage and current accuracy: (Different models have different voltage and current ranges, please refer to the selection guide )
Voltage Source Measure
Range Resolution Accuracy±(%rdg.+V) Resolution Accuracy±(%rdg.+V)
300mV 30uV 0.1%±300uV 30uV 0.1%±300uV
3V 300uV 0.1%±500uV 300uV 0.1%±500uV
30V 3mV 0.1%±3mV 3mV 0.1%±3mV
100V 10mV 0.1%±30mV 10mV 0.1%±30mV
Current Source Measure
Range Resolution Accuracy±(%rdg.+A) Resolution Accuracy±(%rdg.+A)
100nA 10pA 0.1%±0.5nA 10pA 0.1%±0.5nA
1uA 100pA 0.1%±3nA 100pA 0.1%±3nA
10uA 1nA 0.1%±5nA 1nA 0.1%±5nA
100uA 10nA 0.1%±50nA 10nA 0.1%±50nA
1mA 100nA 0.1%±300nA 100nA 0.1%±300nA
10mA 1uA 0.1%±5uA 1uA 0.1%±5uA
100mA 10uA 0.1%±20uA 10uA 0.1%±20uA
1A 100uA 0.1%±2mA 100uA 0.1%±2mA

Applications

1.Nano material properties test: graphene, nanowires, etc
2.Organic material properties test: electronic ink, printing of electronic technology, etc
3.Energy and efficiency characteristic test: LED/AMOLED, solar cells, batteries, DC to DC converters, etc
4.Discrete semiconductor devices feature test: resistor, diode, light emitting diodes, Zener diodes, the PIN diode, BJT transistor, MOSFET, SIC, etc
5.X-ray sensor characteristic test, resistivity, Hall effect, e

Our Company 
Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)Semiconductor Device Characteristics Test Equipment with Large Current Card Source Measure Meter (sub -card CS200)

FQA:
1.Q:Precise is direct factory or trade company?
A: Precise is a factory, and all the SMU R&D are Precise team and manufactured by Precise.
 
2. Q:Sample order is available?
  A:Yes, we accept sample order.
 
3.Q:Do you supply software for SMU operation?
  A:Yes, we can design it as customer's requirement.
 
4.Q:whats the delivery period?
  A:usually, it is around 30 days, and it is also related with order qty.
 
5.Q:what's the warranty?
  A:warranty is 12 month.
 
6.Q: what's the shipping way?
  A:for sample order, usually shipping by international express like DHL, FEDEX, UPS, EMS and so on. If qty is more, by air is also a good choice.

 

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